Peer Review History: Deep Learning and Explainable AI Techniques for Detection and Diagnosis of Faults in Control Systems

Editor(s):

(1) Dr. Yong X. Gan, California State Polytechnic University, Pomona, USA.

Reviewers:

(1) Abdelhamid, University of Constantine 1, Algéria.

(2) Muhammad Aashir Irshad, Northumbria University London, United Kingdom.

(3) Mohammad Gohari, Arak University of Technology, Iran.

Additional Reviewers:

(1)Guy M. Toche Tchio, University of Lome, Cameroon.

(2) Moise Manyol, University of Douala Cameroon, Cameroon.

Additional Reviewers: (Comments received after deadline)

Open Peer Review Policy: Click Here

Specific Comment:

Average Peer review marks at initial stage: 7.83/10

Average Peer review marks at publication stage: 9/10

Peer Review History:


Stage 1 | Original Manuscript | File 1 | NA


Stage 2 | Peer Review Report_1 (Abdelhamid, Algéria) | File 1 | NA


Stage 2 | Peer Review Report_2 (Muhammad Aashir Irshad, United Kingdom) | File 1 | NA


Stage 2 | Peer Review Report_2 (Mohammad Gohari, Iran) | File 1 | NA


Stage 2 | Revised_MS_v1_and_Feedback_v1 | File 1 | File 2


Stage 3 | Comment_Editor_1_v1 | File 1 | NA


Posted in Review History.

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